Scanning Electron Microscopy and X-Ray Microanalysis
Third Edition
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.
Specificaties
ISBN/EAN | 9781461349693 |
Auteur | Joseph Goldstein |
Uitgever | Van Ditmar Boekenimport B.V. |
Taal | Engels |
Uitvoering | Paperback / gebrocheerd |
Pagina's | 689 |
Lengte | 254.0 mm |
Breedte | 178.0 mm |