Scanning Electron Microscopy and X-Ray Microanalysis

Third Edition

Scanning Electron Microscopy and X-Ray Microanalysis voorzijde
Scanning Electron Microscopy and X-Ray Microanalysis achterzijde
  • Scanning Electron Microscopy and X-Ray Microanalysis voorkant
  • Scanning Electron Microscopy and X-Ray Microanalysis achterkant

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.

Specificaties
ISBN/EAN 9781461349693
Auteur Joseph Goldstein
Uitgever Van Ditmar Boekenimport B.V.
Taal Engels
Uitvoering Paperback / gebrocheerd
Pagina's 689
Lengte 254.0 mm
Breedte 178.0 mm

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